DocumentCode
3294810
Title
Multi-band NDSA measurements between two counter-rotating LEO satellites for estimating the tropospheric water vapor profile
Author
Cuccoli, Fabrizio ; Facheris, Luca
Author_Institution
Dipt. di Ing. Elettron., Univ. di Firenze, Florence, Italy
fYear
2010
fDate
25-30 July 2010
Firstpage
2968
Lastpage
2971
Abstract
NDSA (Normalized Differential Spectral Absorption) was proposed as a differential attenuation measurement method to estimate the total content of water vapor (IWV, Integrated Water Vapor) along a tropospheric propagation path between two Low Earth Orbit (LEO) satellites during a relative occultation event. The NDSA approach is based on the estimate of a “spectral sensitivity parameter” that can be directly converted into IWV through empirical relationships In this paper we present the multi-band approach to convert the five simultaneous Ku, K and M spectral sensitivity measurements (17, 19, 21, 179 and 182 GHz) into an integrated water vapor profile up to 14 km tangent altitude. The algorithm is based on the estimate of the SNR (Signal to Noise Ratio) at the receiver, so as to exploit adaptively at every tangent altitude the optimal channel, based on actual signal conditions.
Keywords
artificial satellites; atmospheric humidity; atmospheric measuring apparatus; troposphere; Low Earth Orbit satellites; Normalized Differential Spectral Absorption; counter-rotating LEO satellites; differential attenuation measurement method; frequency 17 GHz; frequency 179 GHz; frequency 182 GHz; frequency 19 GHz; frequency 21 GHz; multiband NDSA measurements; relative occultation event; spectral sensitivity parameter; tropospheric propagation path; tropospheric water vapor profile; water vapor total content; Atmospheric measurements; Atmospheric modeling; Extraterrestrial measurements; Low earth orbit satellites; Sensitivity; Signal to noise ratio; attenuation; microwaves; satellite; water vapor;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5649261
Filename
5649261
Link To Document