Title :
Trace routing effects on crosstalk signals in high-density integrated circuits
Author :
Chen, Yinchao ; Yang, Shuhui ; Sun, Liguo ; Sun, Kunquan
Author_Institution :
Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
Abstract :
In this paper, we target to investigate the crosstalk between two adjacent traces by studying the effects of their spacing and orientation. It is found that the trace routing is a critical way to reduce the crosstalk between two traces designed in high-density integrated circuits. Simulation results show that two vertical traces result in the smallest crosstalk and that the crosstalk signals are insensitive to the spacing increment between two parallel traces in the range investigated.
Keywords :
crosstalk; integrated circuit design; network routing; crosstalk signals; high-density integrated circuit; simulation results; trace routing effect; Crosstalk; Routing;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location :
Suzhou, Jiangsu
Print_ISBN :
978-1-4244-3911-9
Electronic_ISBN :
1946-1542
DOI :
10.1109/IPFA.2009.5232656
