• DocumentCode
    3294921
  • Title

    Investigating useful and distinguishing features around the eyelash region

  • Author

    Li, Yung-hui ; Savvides, Marios ; Chen, Tsuhan

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA
  • fYear
    2008
  • fDate
    15-17 Oct. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Traditionally, iris recognition is always about analyzing and extracting features from iris texture. We proposed to investigate regions around eyelashes and extract useful information which helps us to perform ethnic classification. We propose an algorithm which is easy to implement and effective. First, we locate eyelash region by using ASM to model eyelid boundary. Second, we extract local patch around local landmarks. After image processing, we are able to separate eyelashes and extract features from the directions of eyelashes. Those features are descriptive and can be used to train classifiers. Experimental results show our method can successfully perform East-Asian/Caucasian classification up to 93% accuracy, which shows our proposed method is useful and promising.
  • Keywords
    biometrics (access control); feature extraction; image classification; image recognition; East-Asian/Caucasian classification; ethnic classification; eyelash region; eyelid boundary; feature extraction; image processing; iris recognition; soft biometrics; Biometrics; Data mining; Eyelashes; Eyelids; Face recognition; Feature extraction; Image processing; Information analysis; Iris recognition; Linear discriminant analysis; ASM; ethnic classification; eyelash analysis; soft biometrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Imagery Pattern Recognition Workshop, 2008. AIPR '08. 37th IEEE
  • Conference_Location
    Washington DC
  • ISSN
    1550-5219
  • Print_ISBN
    978-1-4244-3125-0
  • Electronic_ISBN
    1550-5219
  • Type

    conf

  • DOI
    10.1109/AIPR.2008.4906451
  • Filename
    4906451