Title :
Recipe-independent Tool Health Indicator and Fault Prognosis
Author :
Chen, Argon ; Blue, Jakey ; Chou, Tze-Chin ; Yang, Tsu-Kuang
Author_Institution :
Nat. Taiwan Univ., Taipei
Abstract :
Advanced sensor and information technologies have made real-time tool data readily accessible to equipment and process engineers. With the real-time tool data, one can evaluate the overall tool condition so that tool maintenance can be more effectively scheduled and the post-maintenance tool condition can be more easily checked. However, due to the frequent change of the recipes and the diversity of operations, the overall tool health is very difficult to evaluate. This paper provides a recipe-independent health indicator to faithfully reflect the tool condition regardless of recipe/operation changes. A two-steps fault prognosis method is then developed to find the root causes when the tool health signals a problem. The proposed indicator and prognosis methods are tested and demonstrated through an applied materials PECVD tool data from a FAB in Taiwan.
Keywords :
condition monitoring; fault diagnosis; maintenance engineering; semiconductor device manufacture; applied materials PECVD tool; fault prognosis; real-time tool data; recipe-independent health indicator; seminconductor manufacturing; tool condition; tool maintenance; Argon; Costs; Data engineering; Information technology; Investments; Laboratories; Manufacturing industries; Mechanical engineering; Modems; Production facilities;
Conference_Titel :
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-4-9904138-0-4
DOI :
10.1109/ISSM.2006.4493136