DocumentCode
3295147
Title
A new Methodology for Short Circuit Localization on Integrated Circuits using Magnetic Microscopy Technique Coupled with Simulations
Author
Infante, F. ; Perdu, P. ; Petremont, S. ; Lewis, D.
Author_Institution
Centre Nat. d´´Etudes Spatiales, Toulouse, France
fYear
2009
fDate
6-10 July 2009
Firstpage
208
Lastpage
212
Abstract
This article shows how the magnetic technique can be improved to obtain more precise information about fault localization, particularly when other techniques cannot be used. We propose a new methodology based on the coupling of magnetic measurements with magnetic simulations, which we validate on a real case device.
Keywords
integrated circuit packaging; fault localization; integrated circuits; magnetic measurements; magnetic microscopy technique; magnetic simulations; short circuit localization; Circuit simulation; Coupling circuits; Detectors; Integrated circuit packaging; Magnetic analysis; Magnetic circuits; Magnetic field measurement; Magnetic fields; Micromagnetics; Optical imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location
Suzhou, Jiangsu
ISSN
1946-1542
Print_ISBN
978-1-4244-3911-9
Electronic_ISBN
1946-1542
Type
conf
DOI
10.1109/IPFA.2009.5232668
Filename
5232668
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