Title :
Effects of radiation on digital architectures: one year results from a satellite experiment
Author :
Velazco, R. ; Cheynet, P. ; Ecoffet, R.
Author_Institution :
Lab. TIMA, Grenoble, France
Abstract :
Twenty-four experiments on-board a scientific satellite, successfully launched by Naval Research Laboratories, are operating in a high radiation environment since November 1997. Two of these experiments, designed by TIMA in collaboration with CNES (French Space Agency) were programmed to provide evidences of Artificial Neural Network intrinsic fault tolerance properties. This paper presents conclusions issued of the analysis of more than one year telemetred data.
Keywords :
digital integrated circuits; fault tolerant computing; integrated circuit reliability; neural chips; radiation effects; redundancy; ANN intrinsic fault tolerance properties; artificial neural network; digital architectures; high radiation environment; radiation effects; satellite experiment; scientific satellite; telemetred data analysis; Artificial neural networks; Computer architecture; Emulation; Fault tolerance; Hardware; Neurons; Parallel processing; Physics computing; Satellites; Signal processing algorithms;
Conference_Titel :
Integrated Circuits and Systems Design, 1999. Proceedings. XII Symposium on
Conference_Location :
Natal, Brazil
Print_ISBN :
0-7695-0387-X
DOI :
10.1109/SBCCI.1999.803112
