Title :
IEEE recommended practice for powering and grounding electronic equipment. (Color Book Series - Emerald Book)
Author :
Cardoso, Paulo Sérgio ; Strum, Marius ; Amazonas, J.R.de.A. ; Chau, Wang Jiang
Author_Institution :
Dept. de Engenharia Eletronica, Sao Paulo Univ., Brazil
Abstract :
Linear feedback shift registers (LFSRs) and cellular automata (CA) are well known structures that generate pseudo-random vector sequences. Quasi-Uniform Linear Cellular Automata (QULCA) were shown to be the simplest (most uniform) CAs capable of generating maximum length sequences. In this paper we compare the performance between two types of QULCA, called QULCA90 and QULCA150, and two particular types of LFSRs, namely, QULFSRMIN and QULFSRMAX. They present respectively the minimum and maximum number of EXOR gates in their feedback path, while still generating maximum length sequences. These four types of structures present good characteristics when used as TPGs in a high level synthesis environment for Built-in Self-Testable (BIST) applications. The comparison was based on the area overhead required to generate each structure and on the test length required to achieve a given Fault Coverage (FC). The well known ISCAS 85 benchmark circuits were used in our work. We show that in most cases the QULCA present superior performance than the better known LFSRs while not consuming much more area
Keywords :
binary sequences; built-in self test; cellular automata; integrated circuit testing; logic testing; shift registers; BIST applications; EXOR gates; LFSR; QULCA150; QULCA90; QULFSRMAX; QULFSRMIN; TPG; area overhead; built-in self-test; fault coverage; feedback path; high level synthesis environment; linear feedback shift registers; maximum length sequences; pseudo-random vector sequences; quasi-uniform linear cellular automata; test pattern generators; Books; Built-in self-test; Circuit testing; Content addressable storage; Electronic equipment; Grounding; High level synthesis; Linear feedback shift registers; Power systems; Vectors;
Conference_Titel :
Integrated Circuits and Systems Design, 1999. Proceedings. XII Symposium on
Conference_Location :
Natal
Print_ISBN :
0-7695-0387-X
DOI :
10.1109/SBCCI.1999.803121