DocumentCode :
3295510
Title :
Design of Thin Membrane with Metal Layer Using FEM
Author :
Moiseev, Alexander A. ; Ilves, Andrew G. ; Korlyakov, Andrew V.
Author_Institution :
ETU Saint-Petersburg, Saint-Petersburg
fYear :
2007
fDate :
June 1 2007-July 5 2007
Firstpage :
109
Lastpage :
112
Abstract :
In this paper, mechanical sensitivity and deflection of center is compared with thin planar membrane, thin corrugated membrane and thin corrugated membrane with metal layer. All models have been developed by realizing the initial stress. Finite element model simulation results show that mechanical sensitivity of corrugated membrane with metal layer is less than a sensitivity of corrugated membrane. Considered sensitive element with metal layer has been designed and fabricated using silicon micro-machining technologies. Small sensitivity of corrugated membrane with metal layer is explained by residual stresses in metal layer after cooling construction.
Keywords :
finite element analysis; internal stresses; membranes; micromachining; micromechanical devices; sensitivity; silicon; MEMS; finite element model simulation; mechanical sensitivity; metal layer; residual stresses; silicon micromachining technologies; thin corrugated membrane; thin planar membrane design; Acoustic sensors; Biomembranes; Computer aided engineering; Cooling; Finite element methods; Geometry; Micromechanical devices; Microphones; Residual stresses; Solid modeling; FEM; corrugated membrane; deflection; mechanical sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials, 2007. EDM '07. 8th Siberian Russian Workshop and Tutorial on
Conference_Location :
Erlagol, Altai
ISSN :
1815-3712
Print_ISBN :
978-5-7782-0752-3
Type :
conf
DOI :
10.1109/SIBEDM.2007.4292927
Filename :
4292927
Link To Document :
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