Title :
The analysis of failure rate and reliability test for LED based general lighting
Author :
Park, S.H. ; Kim, K.H. ; Ryu, Y.C. ; Lee, Y.C. ; Lim, S.H. ; Cho, Y.I. ; Hwang, N.
Author_Institution :
Korea Photonics Technol. Inst., Gwang-ju, South Korea
Abstract :
We had achieved the accelerated life test for and the accelerating factor and activation energy based on the results obtained for the LED PKG. In this results, We had evaluated failure rate for LED lighting array and made reference to Mil-HDBK-217F for basic standard.
Keywords :
failure analysis; life testing; light emitting diodes; reliability; LED PKG; LED based general lighting; LED lighting array; accelerated life test; accelerating factor; activation energy; failure rate; light emitting diode; reliability test; Equations; Failure analysis; LED lamps; Life estimation; Life testing; Light emitting diodes; Light sources; Temperature; Thermal management; Thermal resistance;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5596-6
DOI :
10.1109/IPFA.2010.5531975
