DocumentCode
3295690
Title
The analysis of failure rate and reliability test for LED based general lighting
Author
Park, S.H. ; Kim, K.H. ; Ryu, Y.C. ; Lee, Y.C. ; Lim, S.H. ; Cho, Y.I. ; Hwang, N.
Author_Institution
Korea Photonics Technol. Inst., Gwang-ju, South Korea
fYear
2010
fDate
5-9 July 2010
Firstpage
1
Lastpage
2
Abstract
We had achieved the accelerated life test for and the accelerating factor and activation energy based on the results obtained for the LED PKG. In this results, We had evaluated failure rate for LED lighting array and made reference to Mil-HDBK-217F for basic standard.
Keywords
failure analysis; life testing; light emitting diodes; reliability; LED PKG; LED based general lighting; LED lighting array; accelerated life test; accelerating factor; activation energy; failure rate; light emitting diode; reliability test; Equations; Failure analysis; LED lamps; Life estimation; Life testing; Light emitting diodes; Light sources; Temperature; Thermal management; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location
Singapore
ISSN
1946-1542
Print_ISBN
978-1-4244-5596-6
Type
conf
DOI
10.1109/IPFA.2010.5531975
Filename
5531975
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