DocumentCode
3295744
Title
How do power supply voltage, pixel dwell time and test program duration affect the accuracy of Soft Defect Localization technique
Author
Wu Chunlei ; Zhai, Lianyin ; Motohiko, Masuda ; Ma, Hui ; Wang, W. ; Liu, Jiangchuan ; Liu, Jiangchuan
Author_Institution
Freescale Semicond. (China) Ltd., Tianjin, China
fYear
2010
fDate
5-9 July 2010
Firstpage
1
Lastpage
4
Abstract
In our laboratory, Soft Defect Localization (SDL) technique without a synchronization signal is realized by Optical Beam Induced Resistance Change (OBIRCH). But the accuracy of this SDL technique depends on power supply voltage, pixel dwell time and test program duration. In this paper, we will present experimental results to show how to affect the accuracy of SDL technique by these three factors.
Keywords
electron device testing; power supply circuits; optical beam induced resistance change; pixel dwell time; power supply voltage; soft defect localization technique; synchronization signal; test program duration affect; Frequency synchronization; Horses; Laboratories; Laser theory; Laser transitions; Microscopy; Power supplies; Semiconductor device testing; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location
Singapore
ISSN
1946-1542
Print_ISBN
978-1-4244-5596-6
Type
conf
DOI
10.1109/IPFA.2010.5531979
Filename
5531979
Link To Document