Title :
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages
Author :
Kor, H.B. ; Chang, A.C.K. ; Gan, C.L.
Author_Institution :
Sch. of Mater. Sci. & Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
Ablation was carried out on high voltage Schottky rectifiers at 25°C and -5°C (with a thermoelectric cooler or TEC), at 1.0 W and 3.9 W of laser power. In-situ measurement of the reverse current was conducted and correlated to the device junction temperature. It was found that the usage of a TEC increases the number of laser scans to reach the set current compliance of 100 μA after exposing the die, for ablation at 3.9 W, although eventual damage to the device is still unavoidable. The incorporation of a TEC below the sample is also demonstrated to be effective in reducing the device junction temperature during laser ablation.
Keywords :
laser ablation; plastic packaging; rectifying circuits; temperature control; thermal management (packaging); thermoelectric devices; current 100 muA; device junction temperature; high voltage Schottky rectifiers; laser ablation; laser decapsulation; plastic packages; power 1.0 W; power 3.9 W; reverse current in-situ measurement; temperature -5 degC; temperature 25 degC; temperature control; thermoelectric cooler; Chemical lasers; Current measurement; Laser ablation; Plasma temperature; Plastic packaging; Power lasers; Schottky diodes; Temperature control; Thermoelectricity; Voltage;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5596-6
DOI :
10.1109/IPFA.2010.5531987