DocumentCode :
3295957
Title :
Logic LSI technology roadmap for 22 nm and beyond
Author :
Iwai, Hiroshi
Author_Institution :
Frontier Res. Canter, Tokyo Inst. of Technol., Yokohama, Japan
fYear :
2009
fDate :
6-10 July 2009
Firstpage :
7
Lastpage :
10
Abstract :
Logic CMOS technology roadmap for dasia22 nm and beyondpsila is described with ITRS (International Technology Roadmap for Semiconductor) as a reference. In the ITRS 2008 Update published just recently, there has been some significant change in the trend of the gate length. The predicted trend has been amended to be less aggressive from the ITRS 2008-Update, resulting in the delay in the gate-length shrinkage for 3 years in the short term and 5 years in the long term from those predicted in ITRS 2007. Regarding the downsize limit, it would take probably 20 to 30 years until we reach the final limit, because the duration between the generations will become longer when approaching the limit. In order to suppress the off-leakage current, double gate (DG) or fin-FET type MOSFETs are the most promising. Then, it is a natural extension for DG FETs to evolve to Si-nanowire MOSFETs as the ultimate structure of transistors for CMOS circuit applications. Si-nanowire FETs are more attractive than the conventional DG FETs because of higher on-current conduction due to their quantum nature and also because of their adoptability for high-density integration including that of 3D. Then, what will come next after reaching the final limit of the downsizing? The answer is new algorithm. In the latter half of this century, the application of algorithm used for the natural bio system will make the integrated circuits operation tremendously high efficiency. Much higher performance with ultimately low power consumption will be realized.
Keywords :
CMOS logic circuits; MOSFET; large scale integration; silicon; CMOS logic technology; MOSFET; Si; finFET; gate-length shrinkage; logic large scale integration; off-leakage current; size 22 nm; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Delay; Energy consumption; FETs; Large scale integration; Lithography; MOSFETs; Resists;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location :
Suzhou, Jiangsu
ISSN :
1946-1542
Print_ISBN :
978-1-4244-3911-9
Electronic_ISBN :
1946-1542
Type :
conf
DOI :
10.1109/IPFA.2009.5232710
Filename :
5232710
Link To Document :
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