Title :
Reliability qualification of photovoltaic smart panel electronics
Author :
Chaparala, Prasad ; Li, Erhong ; Bhola, Sameer
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
Abstract :
This paper describes reliability qualification methodologies for the distributed power electronic products and panel integrated electronics used in the photovoltaic (PV) industry. Lifetimes for PV electronic products under harsh outdoor conditions are expected to be more than twenty years to match the commercial solar panel lifetimes in the market. Some of the key reliability challenges and qualification tests to validate reliability of PV electronic products are presented.
Keywords :
photovoltaic power systems; solar cells; distributed power electronic products; panel integrated electronics; photovoltaic smart panel electronics; reliability qualification methodology; solar panel lifetimes; Consumer electronics; Inverters; Life estimation; Photovoltaic systems; Power electronics; Power system reliability; Qualifications; Solar power generation; Temperature distribution; Thermal management;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5596-6
DOI :
10.1109/IPFA.2010.5531993
