DocumentCode
3296023
Title
Reliability qualification of photovoltaic smart panel electronics
Author
Chaparala, Prasad ; Li, Erhong ; Bhola, Sameer
Author_Institution
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear
2010
fDate
5-9 July 2010
Firstpage
1
Lastpage
4
Abstract
This paper describes reliability qualification methodologies for the distributed power electronic products and panel integrated electronics used in the photovoltaic (PV) industry. Lifetimes for PV electronic products under harsh outdoor conditions are expected to be more than twenty years to match the commercial solar panel lifetimes in the market. Some of the key reliability challenges and qualification tests to validate reliability of PV electronic products are presented.
Keywords
photovoltaic power systems; solar cells; distributed power electronic products; panel integrated electronics; photovoltaic smart panel electronics; reliability qualification methodology; solar panel lifetimes; Consumer electronics; Inverters; Life estimation; Photovoltaic systems; Power electronics; Power system reliability; Qualifications; Solar power generation; Temperature distribution; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location
Singapore
ISSN
1946-1542
Print_ISBN
978-1-4244-5596-6
Type
conf
DOI
10.1109/IPFA.2010.5531993
Filename
5531993
Link To Document