Title :
How could device security against unauthorized internal chip access be married with design for testability?
Author_Institution :
Dept. 173 Electron., Empa Swiss Fed. Labs. for Mater. Testing & Res., Duebendorf, Switzerland
Abstract :
New devices with security-critical functions like in money-or credit cards frequently have protective top metal layers in order to avoid unauthorized internal chip-access for testing or modifying the device. However, design/ process debug and FA need such access to accelerate learning for production ramp-up and design debugging. The paper shows a design approach how to allow authorized access for internal probing in such case.
Keywords :
authoring systems; design for testability; security of data; authorized access; design for testability; device security; internal probing; unauthorized internal chip access; Chemical analysis; Debugging; Design for testability; Electronic equipment testing; Manufacturing; Materials testing; Protection; RLC circuits; Security; Thermomechanical processes;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5596-6
DOI :
10.1109/IPFA.2010.5532006
