DocumentCode :
3296434
Title :
Experimental Semiconductor Nanoelectronics in Institute of Semiconductor Physics SB RAS
Author :
Neizvestny, Igor G.
Author_Institution :
Siberian Branch of Russian Acad. of Sci., Novosibirsk
fYear :
2007
fDate :
June 1 2007-July 5 2007
Firstpage :
16
Lastpage :
18
Abstract :
This paper deals with the technologies in Institute of Semiconductor Physics SB RAS which are the preparation of initial nanometer size thickness structures (substrates ) by molecular beam epitaxy method (MBE) and silicon on insulator (SOI) method, the methods forming of nanometer size lateral structures by electron beam lithography and atomic force microscopy, and the methods forming three dimensions nanostructures (nanotubes) by self-scrolling highly strained heterolayers.
Keywords :
atomic force microscopy; electron beam lithography; molecular beam epitaxial growth; nanoelectronics; semiconductor technology; silicon-on-insulator; Institute of Semiconductor Physics SB RAS; MBE method; SOI method; atomic force microscopy; electron beam lithography; molecular beam epitaxy method; nanometer size lateral structures; self-scrolling highly strained heterolayers; semiconductor nanoelectronics; silicon on insulator method; Atomic beams; Atomic force microscopy; Electron beams; Lithography; Molecular beam epitaxial growth; Nanoelectronics; Nanostructures; Physics; Silicon on insulator technology; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials, 2007. EDM '07. 8th Siberian Russian Workshop and Tutorial on
Conference_Location :
Erlagol, Altai
ISSN :
1815-3712
Print_ISBN :
978-5-7782-0752-3
Type :
conf
DOI :
10.1109/SIBEDM.2007.4292975
Filename :
4292975
Link To Document :
بازگشت