Title :
Experimental Semiconductor Nanoelectronics in Institute of Semiconductor Physics SB RAS
Author :
Neizvestny, Igor G.
Author_Institution :
Siberian Branch of Russian Acad. of Sci., Novosibirsk
fDate :
June 1 2007-July 5 2007
Abstract :
This paper deals with the technologies in Institute of Semiconductor Physics SB RAS which are the preparation of initial nanometer size thickness structures (substrates ) by molecular beam epitaxy method (MBE) and silicon on insulator (SOI) method, the methods forming of nanometer size lateral structures by electron beam lithography and atomic force microscopy, and the methods forming three dimensions nanostructures (nanotubes) by self-scrolling highly strained heterolayers.
Keywords :
atomic force microscopy; electron beam lithography; molecular beam epitaxial growth; nanoelectronics; semiconductor technology; silicon-on-insulator; Institute of Semiconductor Physics SB RAS; MBE method; SOI method; atomic force microscopy; electron beam lithography; molecular beam epitaxy method; nanometer size lateral structures; self-scrolling highly strained heterolayers; semiconductor nanoelectronics; silicon on insulator method; Atomic beams; Atomic force microscopy; Electron beams; Lithography; Molecular beam epitaxial growth; Nanoelectronics; Nanostructures; Physics; Silicon on insulator technology; Substrates;
Conference_Titel :
Electron Devices and Materials, 2007. EDM '07. 8th Siberian Russian Workshop and Tutorial on
Conference_Location :
Erlagol, Altai
Print_ISBN :
978-5-7782-0752-3
DOI :
10.1109/SIBEDM.2007.4292975