Title :
A review of IC fabrication design and assembly defects manifested as field failures in Air Force avionic equipment
Author :
Green, Thomas J.
Author_Institution :
Rome Air Dev. Center, Griffiss AFB, NY, USA
Abstract :
In 1986, Rome Air Development Center (RADC) initiated a microcircuit and hybrid field return and failure analysis program. Data from that program along with case studies from each of the three major failure categories are presented. Emphasis is placed on microcircuit failures that were the result of design, fabrication and assembly defects. The purpose of the RADC work is to lay the groundwork for a US Department of Defense parts return and failure analysis program and to demonstrate the importance of analyzing field failures
Keywords :
aircraft instrumentation; failure analysis; integrated circuit testing; Air Force avionic equipment; IC fabrication; Rome Air Development Center; assembly defects; design defects; fabrication defects; failure analysis; field failures; microcircuit failures; Aerospace electronics; Assembly; Circuits; Defense industry; Fabrication; Failure analysis; Feedback; Government; Microprocessors; Weapons;
Conference_Titel :
Reliability Physics Symposium 1988. 26th Annual Proceedings., International
Conference_Location :
Monterey, CA
DOI :
10.1109/RELPHY.1988.23454