DocumentCode
3296552
Title
Content
fYear
2009
fDate
6-10 July 2009
Abstract
Presents the table of contents of the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location
Suzhou, Jiangsu
ISSN
1946-1542
Print_ISBN
978-1-4244-3911-9
Type
conf
DOI
10.1109/IPFA.2009.5232741
Filename
5232741
Link To Document