Title :
When IC yield missed the target, who is at fault?
Author :
Lanza, L. ; Strojwas, A. ; Campbell, M. ; Gerousis, V.C. ; Hogan, J. ; Kibarian, J. ; Levitt, M. ; Ng, W. ; Pramanik, D. ; Templeton, M.
Author_Institution :
Lanza techVentures, Palo Alto, CA
Abstract :
Silicon yield once was dominated by contaminants and particulates, making yield a process issue. But with today´s electronics supply chain, multiple suspects may be indicted on manufacturability issues. Who is responsible for preventative actions in manufacturability and yield? The panelists, representing a foundry, a fabless company, an IP provider, two EDA vendors, and an IC design team, will discuss the problems and the solutions for achieving manufacturability and yield goals.
Keywords :
Electronic design automation and methodology; Foundries; Manufacturing; Semiconductor device manufacture; Silicon; Supply chains;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8