Title :
Investigation of ghosting in a-Se detector under large accumulated radiation exposure
Author :
Fang, Guang ; Pearson, Dave ; Harper, Brent ; Spence, Dave ; Schmidt, Richard ; Mackie, Rock ; Olivera, Gustova ; Rau, Andreas ; Rowlands, John
Author_Institution :
Thomotherapy Inc., Madison, WI
Abstract :
This paper reports results on investigations of a-Se detectors transport properties under radiotherapy environment using Time of Flight (TOF) technique. The study focused on measurement of hole and electron mobility and investigation of ghosting and recovery behavior associated with the transport properties of holes and electrons traversing the a-Se layers separately using light pulses to generate charge packets at the surface of the detector
Keywords :
electron mobility; hole mobility; particle detectors; radiation therapy; Se; a-Se detector; charge packets; electron mobility; ghosting; hole mobility; large accumulated radiation exposure; light pulses; radiotherapy; recovery behavior; time of flight technique; transport properties; Amorphous materials; Charge measurement; Current measurement; Electron mobility; Pulse measurements; Radiation detectors; Semiconductor radiation detectors; Telephony; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596844