DocumentCode :
3296735
Title :
Investigation of ghosting in a-Se detector under large accumulated radiation exposure
Author :
Fang, Guang ; Pearson, Dave ; Harper, Brent ; Spence, Dave ; Schmidt, Richard ; Mackie, Rock ; Olivera, Gustova ; Rau, Andreas ; Rowlands, John
Author_Institution :
Thomotherapy Inc., Madison, WI
Volume :
5
fYear :
2005
fDate :
23-29 Oct. 2005
Firstpage :
2483
Lastpage :
2487
Abstract :
This paper reports results on investigations of a-Se detectors transport properties under radiotherapy environment using Time of Flight (TOF) technique. The study focused on measurement of hole and electron mobility and investigation of ghosting and recovery behavior associated with the transport properties of holes and electrons traversing the a-Se layers separately using light pulses to generate charge packets at the surface of the detector
Keywords :
electron mobility; hole mobility; particle detectors; radiation therapy; Se; a-Se detector; charge packets; electron mobility; ghosting; hole mobility; large accumulated radiation exposure; light pulses; radiotherapy; recovery behavior; time of flight technique; transport properties; Amorphous materials; Charge measurement; Current measurement; Electron mobility; Pulse measurements; Radiation detectors; Semiconductor radiation detectors; Telephony; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
ISSN :
1095-7863
Print_ISBN :
0-7803-9221-3
Type :
conf
DOI :
10.1109/NSSMIC.2005.1596844
Filename :
1596844
Link To Document :
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