DocumentCode :
3296784
Title :
Characterizing metastability and jitter in CMOS latch/flip-flop used as a digital mixer
Author :
Shankar, I. ; Morris, S.A. ; Hutchens, C.G.
Author_Institution :
Sch. of Electr. & Comput. Sci. Eng., Oklahoma State Univ., Stillwater, OK, USA
Volume :
3
fYear :
2002
fDate :
4-7 Aug. 2002
Abstract :
A novel low power silicon-on-insulator (SOI) CMOS digital mixer circuit that is small, fully integrable and easily implemented is presented. This circuit is for use in a microbalance counter circuit (MBC) that operates at temperatures up to 180 degrees Celsius for petroleum industry well logging applications and has a measurement acquisition time of 2.4 seconds and a frequency resolution of 59 nHz when measuring 7 MHz signals. The digital mixer circuit eliminates the need for an analog mixer and bulky, temperature sensitive low pass filter components. This paper focuses on modeling and analysis of the metastable behavior and measurement inaccuracy caused by input phase jitter of the digital mixer. There is a risk of miscount due to jitter in the input signals. This paper explains how to model this risk and generate design parameters given the user´s criteria for maximum risk of count errors.
Keywords :
CMOS logic circuits; circuit stability; counting circuits; flip-flops; frequency measurement; integrated circuit design; jitter; logic design; low-power electronics; microbalances; mixers (circuits); silicon-on-insulator; 180 degC; 2.4 sec; 7 MHz; CMOS latch/flip-flop mixer; MBC; SOI; Si-SiO2; count errors; digital mixer; frequency measurement circuit; frequency resolution; input phase jitter; low power mixer; measurement acquisition time; measurement inaccuracy; metastability characterisation; microbalance counter circuit; miscount risk; petroleum industry; silicon-on-insulator; well logging measurement acquisition; CMOS digital integrated circuits; Counting circuits; Flip-flops; Frequency measurement; Jitter; Latches; Metastasis; Silicon on insulator technology; Temperature sensors; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
Type :
conf
DOI :
10.1109/MWSCAS.2002.1187098
Filename :
1187098
Link To Document :
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