Title :
Attenuation Measurement Technique for Printed Circuit Board Traces in a Production Environment
Author :
Schuster, Christian ; Deutsch, Alina ; Klink, Erich ; Krabbenhoft, Roger
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY
Abstract :
In this paper we explore an attenuation measurement technique for PCB traces that is simple, robust, and quick enough to be a viable solution for a printed circuit board production environment. The technique is based on time domain reflectometry and transmission (TDR/T) measurements of two traces of different length. The result is the trace attenuation with respect to frequency. The technique combines well-known time and frequency domain algorithms. Comparison of experimental data to alternative time and frequency domain approaches verify the proposed technique up to 15 GHz. The importance of a low reflection signal launch design is discussed
Keywords :
attenuation measurement; printed circuit manufacture; time-domain reflectometry; PCB traces; attenuation measurement technique; frequency domain algorithms; printed circuit board traces; production environment; time domain algorithms; time domain reflectometry and transmission; Attenuation measurement; Frequency domain analysis; Length measurement; Printed circuits; Production; Reflection; Reflectometry; Robustness; Signal design; Time measurement;
Conference_Titel :
Signal Propagation on Interconnects, 2006. IEEE Workshop on
Conference_Location :
Berlin, Germany
Print_ISBN :
1-4244-0455-x
Electronic_ISBN :
1-4244-0455-x
DOI :
10.1109/SPI.2006.289153