DocumentCode :
3296999
Title :
High-Crosstalk Robustness Transmission Line Interconnect in Si LSI using Zero-Crosstalk Structure
Author :
Kimura, Makoto ; Ito, Hiroyuki ; Sugita, Hideyuki ; Okada, Kenichi ; Masu, Kazuya
Author_Institution :
Integrated Res. Inst., Tokyo Inst. of Technol., Yokohama
fYear :
2006
fDate :
9-12 May 2006
Firstpage :
153
Lastpage :
156
Abstract :
This paper proposes a novel bus line structure using differential transmission lines, which equips high-density and high crosstalk-robustness. The feasibility of this structure is discussed from results of two-dimensional electromagnetic simulation and time-domain measurement. Measurement results show that the bus line has higher crosstalk robustness than that of the conventional co-planar line. The bus line can reduce effective density of 55% as compared with the conventional coplanar line
Keywords :
crosstalk; elemental semiconductors; integrated circuit interconnections; large scale integration; silicon; transmission line theory; LSI; Si; bus line structure; differential transmission lines; high-crosstalk robustness transmission line interconnect; time-domain measurement; two-dimensional electromagnetic simulation; zero-crosstalk structure; Crosstalk; Delay; Distributed parameter circuits; Energy consumption; Integrated circuit interconnections; Large scale integration; Noise robustness; Power transmission lines; Transmission lines; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2006. IEEE Workshop on
Conference_Location :
Berlin, Germany
Print_ISBN :
1-4244-0455-x
Electronic_ISBN :
1-4244-0455-x
Type :
conf
DOI :
10.1109/SPI.2006.289157
Filename :
4069439
Link To Document :
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