Title :
A new timing metric for timing error estimation in OFDM
Author :
Rathkanthiwar, A.P. ; Gandhi, A. Sanjeevi
Author_Institution :
Dept. of Electron. Eng., Priyadarshini Coll. of Eng., Nagpur, India
Abstract :
Orthogonal frequency division multiplexing (OFDM) is a bandwidth efficient modulation scheme used widely for high speed data communication. In OFDM system, intersymbol interference (ISI) and intercarrier interference (ICI) occur due to synchronization errors. Fast, simple and robust synchronization algorithms are necessary for OFDM systems. In this paper, a simple and robust algorithm for timing synchronization is proposed. In OFDM downlink transmission, every terminal perform synchronization by exploiting reference symbols called training symbols of received frame. Proposed timing synchronization algorithm is based on use of reference symbol. Performance analysis shows that the proposed timing offset estimator have better performance despite being simple. Performance is studied over AWGN and time-dispersive multipath Rayleigh fading channel with the conclusion that the proposed synchronization technique result in better performance with respect to all the parameters.
Keywords :
AWGN channels; OFDM modulation; Rayleigh channels; error detection; error statistics; intercarrier interference; intersymbol interference; synchronisation; AWGN; OFDM downlink transmission; bandwidth efficient modulation scheme; high speed data communication; intercarrier interference; intersymbol interference; orthogonal frequency division multiplexing; reference symbols; synchronization errors; time dispersive multipath Rayleigh fading channel; timing error estimation; timing metric; timing offset estimator; timing synchronization algorithm; training symbols; AWGN channels; Dispersion; Downlink; Error probability; OFDM; Signal to noise ratio; Synchronization; orthogonal frequency division multiplexing (OFDM); timing estimation;
Conference_Titel :
Wireless Communications, Vehicular Technology, Information Theory and Aerospace & Electronic Systems (VITAE), 2013 3rd International Conference on
Conference_Location :
Atlantic City, NJ
Print_ISBN :
978-1-4799-0237-8
DOI :
10.1109/VITAE.2013.6617058