• DocumentCode
    32973
  • Title

    Numerical Study of Very Small Floating Islands

  • Author

    Watanabe, Hiromi ; Yao, Kai ; Lin, James

  • Author_Institution
    Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    1145
  • Lastpage
    1152
  • Abstract
    The electrical property of very small floating island whose diameter is less than the de Broglie length is numerically investigated without fitting parameters. In general, it is difficult to well define the capacitance of very small floating islands. In this paper, instead of using the capacitance of islands, the kicking algorithm is applied for simulating the single-electron phenomena of spherical islands (the diameter: ø=0.6, 4, and 6 nm). As a result, the self-potentials of islands are successfully obtained within the precision equivalent to the movement of the sole electron with regard to given gate voltages. In addition, the transient simulation is demonstrated using the dwell time during which an electron is waiting for the next tunneling. The Coulomb blockade is successfully simulated without using the capacitance of very small floating islands. It is also found that trap-assisted tunneling is prohibited by Coulomb blockade at low electric field and can occur at high electric field.
  • Keywords
    Coulomb blockade; electric potential; single electron devices; tunnelling; Coulomb blockade; electrical property; island self-potentials; single-electron phenomena; spherical islands; transient simulation; trap-assisted tunneling; very small floating island; Capacitance; Electric potential; Electrodes; Logic gates; Mathematical model; Silicon; Tunneling; Capacitance coupling ratio; Coulomb blockade; device modeling; floating gate; floating island; silicon dot; single-electron phenomena; trap-assisted tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2306935
  • Filename
    6766666