Victim and aggressor line electrical modelisation in an multicoupled interconnect environment for transient simulation

Author

Ponchel, F. ; Legier, Jf ; Paleczny, E. ; Seguinot, C. ; Deschacht, D.

Author_Institution

IEMN, Villeneuve d´´Ascq

fYear

2006

fDate

9-12 May 2006

Firstpage

249

Lastpage

251

Abstract

An electrical modelisation of eight lossy C_u interconnects is proposed thanks to the implementation of a vector finite element method. This full wave analysis gives frequency dependence of proper or mutual inductance, capacitance or resistance from resulting transmission line equations system. Spice results are then proposed for different set of spacing and low dielectric material in case of interconnects whose area is less than 1 m² embedded in S_iO₂ interlevel or other low dielectric material

Keywords

dielectric materials; finite element analysis; interconnections; metallisation; transmission line theory; aggressor line electrical modelisation; dielectric material; full wave analysis; multicoupled interconnect environment; mutual inductance; transient simulation; transmission line equations system; vector finite element method; Clocks; Conductivity; Dielectric losses; Dielectric materials; Finite element methods; Frequency; Mathematical model; Metallization; Power system transients; Shape;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal Propagation on Interconnects, 2006. IEEE Workshop on

Conference_Location

Berlin, Germany

Print_ISBN

1-4244-0455-x

Electronic_ISBN

1-4244-0455-x

Type

conf

DOI

10.1109/SPI.2006.289235

Filename

4069470