• DocumentCode
    3297722
  • Title

    Tool reusable for DSP system emulation and board production testing

  • Author

    Gonzales, David Ruimy

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1996
  • fDate
    4-6 Nov 1996
  • Firstpage
    306
  • Lastpage
    311
  • Abstract
    Tools that support designs that use the IEEE 1149.1 JTAG port for emulation and board test are becoming more common. These tools not only are used to debug hardware and software interaction but are now used to validate the design using sophisticated board test techniques. High level languages are now being used to describe these designs and the complex interaction of boundary scan cells and built in self-test circuits. These tools provide the necessary set of capabilities for getting the job done quickly at all levels of the product life cycle. The use of a 60MHz DSP56002 as a JTAG controller allows developers to utilize a common tool on various computer platforms using a Motorola GUI or developing their own custom built utilities using a set of readily available device drivers and libraries. The three newest Motorola DSP core based architectures (DSP56300, DSP56600 and DSP56800) have IEEE 1149.1 JTAG ports for emulation and pin boundary scan. Development tools which support full source code emulation in the target system as well as board/system level boundary scan cell control are available for these cores
  • Keywords
    automatic testing; boundary scan testing; built-in self test; development systems; printed circuit testing; production testing; 60 MHz; DSP system emulation; IEEE 1149.1 JTAG port; board production testing; board test techniques; boundary scan cells; built in self-test circuits; custom built utilities; full source code emulation; pin boundary scan; product life cycle; Circuit testing; Digital signal processing; Emulation; Hardware; High level languages; Production systems; Software debugging; Software testing; Software tools; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Northcon/96
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-3277-6
  • Type

    conf

  • DOI
    10.1109/NORTHC.1996.564942
  • Filename
    564942