• DocumentCode
    3297852
  • Title

    Durability Analysis of SnAgCu Solder Joints for an Aerospace Application

  • Author

    Lajimi, Amir M. ; Cugnoni, Joel ; Botsis, John

  • Author_Institution
    Syst. Design Eng. Dept., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    131
  • Lastpage
    137
  • Abstract
    In this work, a deep analysis of the reliability of lead-free (SnAgCu) solders in comparison with conventional tin-lead (SnPb) solders was done for a particular aerospace application. Creep properties of this solder composition were investigated, and results were validated with a thermal shock test. A 0805 resistor was considered to simulate creep deformation, an electronic board was used for a thermal shock test to check continuity of the circuit for the specified mission, and finally a detailed metallographic study was done to examine microstructure of solder joints after thermal shock test. Main constitutive relations were implemented in commercial finite-element analysis software (ABAQUS 6.5), to predict creep strain accumulation under thermal loads. Moreover, effects of implementing different constitutive relations in compare with life prediction models were investigated. Overall, both solders are highly reliable with this number of thermal cycles; however, SnAgCu shows higher life time under this type of loading.
  • Keywords
    finite element analysis; mechanical engineering; reliability; solders; thermal engineering; Sn-Ag-Cu; Sn-Pb; aerospace application; creep deformation; durability analysis; electronic board; finite element analysis software; lead-free solder reliability; solder composition; solder joints; thermal cycles; thermal shock test; Aerospace testing; Circuit testing; Creep; Electric shock; Electronic equipment testing; Environmentally friendly manufacturing techniques; Lead; Soldering; Thermal loading; Thermal resistance; Finite-element analysis; SnAgCu; constitutive relation; creep; life-prediction relation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    World Congress on Engineering and Computer Science 2008, WCECS '08. Advances in Electrical and Electronics Engineering - IAENG Special Edition of the
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-3545-6
  • Type

    conf

  • DOI
    10.1109/WCECS.2008.24
  • Filename
    5233185