DocumentCode
3297852
Title
Durability Analysis of SnAgCu Solder Joints for an Aerospace Application
Author
Lajimi, Amir M. ; Cugnoni, Joel ; Botsis, John
Author_Institution
Syst. Design Eng. Dept., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2008
fDate
22-24 Oct. 2008
Firstpage
131
Lastpage
137
Abstract
In this work, a deep analysis of the reliability of lead-free (SnAgCu) solders in comparison with conventional tin-lead (SnPb) solders was done for a particular aerospace application. Creep properties of this solder composition were investigated, and results were validated with a thermal shock test. A 0805 resistor was considered to simulate creep deformation, an electronic board was used for a thermal shock test to check continuity of the circuit for the specified mission, and finally a detailed metallographic study was done to examine microstructure of solder joints after thermal shock test. Main constitutive relations were implemented in commercial finite-element analysis software (ABAQUS 6.5), to predict creep strain accumulation under thermal loads. Moreover, effects of implementing different constitutive relations in compare with life prediction models were investigated. Overall, both solders are highly reliable with this number of thermal cycles; however, SnAgCu shows higher life time under this type of loading.
Keywords
finite element analysis; mechanical engineering; reliability; solders; thermal engineering; Sn-Ag-Cu; Sn-Pb; aerospace application; creep deformation; durability analysis; electronic board; finite element analysis software; lead-free solder reliability; solder composition; solder joints; thermal cycles; thermal shock test; Aerospace testing; Circuit testing; Creep; Electric shock; Electronic equipment testing; Environmentally friendly manufacturing techniques; Lead; Soldering; Thermal loading; Thermal resistance; Finite-element analysis; SnAgCu; constitutive relation; creep; life-prediction relation;
fLanguage
English
Publisher
ieee
Conference_Titel
World Congress on Engineering and Computer Science 2008, WCECS '08. Advances in Electrical and Electronics Engineering - IAENG Special Edition of the
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4244-3545-6
Type
conf
DOI
10.1109/WCECS.2008.24
Filename
5233185
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