• DocumentCode
    329789
  • Title

    Optimal subspace metric design for classification and regression through nonparametric cross validation objective function optimization

  • Author

    Jauch, Thomas W.

  • Author_Institution
    Corp. Res., Robert Bosch GmbH, Stuttgart, Germany
  • Volume
    4
  • fYear
    1998
  • fDate
    11-14 Oct 1998
  • Firstpage
    3614
  • Abstract
    An approach for kernel design is presented. The technique is called “optimal subspace metric design” (OSMD). One of the main drawbacks of many distance based parametric and nonparametric approaches is that they do not use a metric which has a certain kind of orientation, which suits best for the given application. In the approach presented a kernel based technique with a full covariance metric is used. The need for an optimal, task dependent covariance structure is important for the mapping performance. A technique based on Householder reflections is derived, which allows us to model the covariance structure in an optimization procedure. The number of parameters used is only linearly dependent on the input dimension. It is possible to model a singular metric, to obtain a subspace approach. Both the orientation and the kernel width´s of the metric are adapted. To optimize the metric an error function based on the leave one out cross-validation technique is derived. The model is trained in a supervised manner, via the extended Kalman filter technique, and is able to handle both classification and regression tasks
  • Keywords
    Kalman filters; learning (artificial intelligence); matrix algebra; neural nets; nonlinear filters; nonparametric statistics; optimisation; pattern classification; statistical analysis; Householder reflections; and the kernel; full covariance metric; kernel design; nonparametric cross validation objective function optimization; optimal subspace metric design; regression; singular metric; subspace approach; supervised training; task dependent covariance structure; Design optimization; Kernel; Neural networks; Pattern classification; Reflection; Self organizing feature maps; Smoothing methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1062-922X
  • Print_ISBN
    0-7803-4778-1
  • Type

    conf

  • DOI
    10.1109/ICSMC.1998.726627
  • Filename
    726627