DocumentCode :
32979
Title :
Placement for Binary-Weighted Capacitive Array in SAR ADC Using Multiple Weighting Methods
Author :
Yongfu Li ; Zhe Zhang ; Dingjuan Chua ; Yong Lian
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Volume :
33
Issue :
9
fYear :
2014
fDate :
Sept. 2014
Firstpage :
1277
Lastpage :
1287
Abstract :
The overall accuracy and linearity of a matching-limited successive-approximation-register analog-to-digital converter are primarily determined by its digital-to-analog converter´s (DAC´s) matching characteristics. As the resolution of the DAC increases, it is harder to achieve accurate capacitance ratios in the layout, which are affected by systematic and random mismatches. An ideal placement for the DAC array should try to minimize the systematic mismatches, followed by the random mismatch. This paper proposes a placement strategy, which incorporates a matrix-adjustment method for the DAC, and different placement techniques and weighting methods for the placements of active and dummy unit capacitors. The resulting placement addresses both systematic and random mismatches. We consider the following four systematic mismatches such as the first-order process gradients, the second-order lithographic errors, the proximity effects, the wiring complexity, and the asymmetrical fringing parasitics. The experimental results show that the placement strategy achieves smaller capacitance ratio mismatch and shorter computational runtime than those of existing works.
Keywords :
analogue-digital conversion; capacitance; digital-analogue conversion; flip-flops; proximity effect (lithography); SAR ADC; analog-to-digital converter; asymmetrical fringing parasitics; binary-weighted capacitive array; capacitance ratio mismatch; digital-to-analog converter; first-order process gradients; matrix-adjustment method; multiple weighting methods; proximity effects; second-order lithographic errors; successive-approximation-register; wiring complexity; Arrays; Capacitance; Capacitors; Correlation; Layout; Systematics; Wiring; Analog placement; analog-digital-converter; capacitance mismatch ratio; capacitive array; common-centroid; digital-analog-converter; spatial correlation coefficient; successive-approximation-register;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2014.2323217
Filename :
6879589
Link To Document :
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