• DocumentCode
    32979
  • Title

    Placement for Binary-Weighted Capacitive Array in SAR ADC Using Multiple Weighting Methods

  • Author

    Yongfu Li ; Zhe Zhang ; Dingjuan Chua ; Yong Lian

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    33
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    1277
  • Lastpage
    1287
  • Abstract
    The overall accuracy and linearity of a matching-limited successive-approximation-register analog-to-digital converter are primarily determined by its digital-to-analog converter´s (DAC´s) matching characteristics. As the resolution of the DAC increases, it is harder to achieve accurate capacitance ratios in the layout, which are affected by systematic and random mismatches. An ideal placement for the DAC array should try to minimize the systematic mismatches, followed by the random mismatch. This paper proposes a placement strategy, which incorporates a matrix-adjustment method for the DAC, and different placement techniques and weighting methods for the placements of active and dummy unit capacitors. The resulting placement addresses both systematic and random mismatches. We consider the following four systematic mismatches such as the first-order process gradients, the second-order lithographic errors, the proximity effects, the wiring complexity, and the asymmetrical fringing parasitics. The experimental results show that the placement strategy achieves smaller capacitance ratio mismatch and shorter computational runtime than those of existing works.
  • Keywords
    analogue-digital conversion; capacitance; digital-analogue conversion; flip-flops; proximity effect (lithography); SAR ADC; analog-to-digital converter; asymmetrical fringing parasitics; binary-weighted capacitive array; capacitance ratio mismatch; digital-to-analog converter; first-order process gradients; matrix-adjustment method; multiple weighting methods; proximity effects; second-order lithographic errors; successive-approximation-register; wiring complexity; Arrays; Capacitance; Capacitors; Correlation; Layout; Systematics; Wiring; Analog placement; analog-digital-converter; capacitance mismatch ratio; capacitive array; common-centroid; digital-analog-converter; spatial correlation coefficient; successive-approximation-register;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2014.2323217
  • Filename
    6879589