Title :
Shielding effectiveness statistics from random stochastic enclosures with apertures
Author :
Lallechere, Sebastien ; Jannet, Basile ; Dupuy, Thibault ; Bonnet, Pierre ; Paladian, Francoise
Author_Institution :
Clermont Univ., Clermont-Ferrand, France
Abstract :
The aim of this paper is to focus on stochastic techniques used for electromagnetic compatibility (EMC) issues. The growing interest around this topic faces various difficulties related to the considered problem and the stochastic modeling. This work deals with solving numerically (finite integral technique) a shielding effectiveness issue including random geometrical parameters.
Keywords :
electromagnetic compatibility; electromagnetic shielding; statistical analysis; stochastic systems; EMC; apertures; electromagnetic compatibility; finite integral technique; random geometrical parameters; random stochastic enclosures; shielding effectiveness statistics; stochastic modeling; Apertures; Computational modeling; Electromagnetic compatibility; Integrated circuit modeling; Numerical models; Standards; Stochastic processes;
Conference_Titel :
Computational Electromagnetics Workshop (CEM), 2013
Conference_Location :
Izmir
Print_ISBN :
978-1-4799-1432-6
DOI :
10.1109/CEM.2013.6617121
