Title :
Built-in Self-test And Fault Diagnosis Of Fully Differential Analogue Circuits
Author :
Mir, S. ; Kolarik, V. ; Lubaszewski, M. ; Nielsen, C. ; Courtois, B.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Differential amplifiers; Fault diagnosis; Filters; Monitoring; Tin;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629857
