Built-In Self-Test (BIST) in the era of deep sub-micron technology

Design for Test (DFT) techniques are becoming much more commonplace today than just a few years ago. In particular, Built-in Self-Test (BIST) techniques integrate elements of test equipment and interfacing functions into the device under test. BIST not only provides test capabilities, it also provides debug, burn-in, characterization, diagnosis, and many other useful functions. Proven BIST technology is available today. Users of BIST have found the technology useful and effective for many of today´s high-end designs. That is, BIST is not only a technology of the future, but a highly effective technology in use today