Title :
Thermal mark characterization on static magneto-optic metals
Author :
Madison, M.R. ; McDaniel, T.W. ; Nelson, J.S.
Author_Institution :
IBM Corporation
Keywords :
Electric variables measurement; Laser modes; Magnetic field measurement; Magnetooptic recording; Power lasers; Power measurement; Rapid thermal processing; Shape; Size measurement; Temperature distribution;
Conference_Titel :
Magnetics Conference, 1989. Digests of INTERMAG '89., International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTMAG.1989.690297