• DocumentCode
    3298397
  • Title

    A Simplified Self-Checking Design of Multioutput Circuits

  • Author

    Chen, Tongzhao ; Su, Stephen Y H

  • Author_Institution
    Department of Computer Science, State University of New York
  • fYear
    1987
  • fDate
    31896
  • Firstpage
    69
  • Lastpage
    76
  • Keywords
    Circuit faults; Circuit testing; Integrated circuit testing; Logic arrays; Logic testing; Registers; Sequential analysis; System testing; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
  • Type

    conf

  • DOI
    10.1109/STIER.1987.716763
  • Filename
    716763
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3298397