Title :
A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters
Author :
Arabi, Karim ; Kaminska, Bozena ; Rzeszut, Janusz
Keywords :
Analog circuits; Analog-digital conversion; Automatic testing; Built-in self-test; CMOS technology; Circuit testing; Linearity; Logic testing; Test equipment; Voltage;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629860
