Title :
A class of similarity measures between vague sets and its applications to pattern recognition
Author :
Zhang, Fujin ; Wang, Hongxu
Author_Institution :
Electron. Inf. Eng. Coll., Qiongzhou Univ., Sanya, China
Abstract :
The properties of (tu, fu) expand of a vague value have been discussed, and a class of similarity measures between vague sets based on the three-dimensional representation has been presented in this paper. An example applied to pattern recognition shows that these formulas are practicable.
Keywords :
Application software; Computer applications; Educational institutions; Educational technology; Fuzzy set theory; Fuzzy sets; Pattern recognition; pattern recognition; properties of (tu, fu) expand; similarity measures; three-dimensional representation; vague sets;
Conference_Titel :
Educational and Network Technology (ICENT), 2010 International Conference on
Conference_Location :
Qinhuangdao, China
Print_ISBN :
978-1-4244-7660-2
Electronic_ISBN :
978-1-4244-7662-6
DOI :
10.1109/ICENT.2010.5532151
