DocumentCode :
3298777
Title :
X-ray micro radiography using beam hardening correction
Author :
Vavrik, Daniel ; Holy, Tomas ; Jakubek, Jan ; Pospisil, Stanislav ; Vykydal, Zdenek ; Dammer, Jiri
Author_Institution :
Inst. of Theor. & Appl. Mech., Czech Acad. of Sci., Prague
Volume :
5
fYear :
2005
fDate :
23-29 Oct. 2005
Firstpage :
2989
Lastpage :
2992
Abstract :
The system presented provides high quality micro radiographs including very low contrast and low absorption objects. An important source of image distortion arises from beam hardening effects. When left uncorrected, distortion blurs low contrast image elements. Using a cooled digital X-ray semiconductor detector together with the proposed beam hardening correction procedure brings high dynamic range and very low noise of the acquired radiographs over the entire X-ray source spectrum. Both soft and hard parts of the object appear with high contrast and spatial resolution in the resulting radiographs. The beam hardening correction procedure is fully automated using a set of the calibrators and appropriate software modules
Keywords :
X-ray apparatus; X-ray effects; radiography; semiconductor counters; X-ray microradiography; beam hardening correction; beam hardening effects; digital X-ray semiconductor detector; image distortion; Attenuation; Calibration; Dynamic range; Polynomials; Radiography; Semiconductor device noise; Spatial resolution; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
ISSN :
1095-7863
Print_ISBN :
0-7803-9221-3
Type :
conf
DOI :
10.1109/NSSMIC.2005.1596959
Filename :
1596959
Link To Document :
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