• DocumentCode
    3298777
  • Title

    X-ray micro radiography using beam hardening correction

  • Author

    Vavrik, Daniel ; Holy, Tomas ; Jakubek, Jan ; Pospisil, Stanislav ; Vykydal, Zdenek ; Dammer, Jiri

  • Author_Institution
    Inst. of Theor. & Appl. Mech., Czech Acad. of Sci., Prague
  • Volume
    5
  • fYear
    2005
  • fDate
    23-29 Oct. 2005
  • Firstpage
    2989
  • Lastpage
    2992
  • Abstract
    The system presented provides high quality micro radiographs including very low contrast and low absorption objects. An important source of image distortion arises from beam hardening effects. When left uncorrected, distortion blurs low contrast image elements. Using a cooled digital X-ray semiconductor detector together with the proposed beam hardening correction procedure brings high dynamic range and very low noise of the acquired radiographs over the entire X-ray source spectrum. Both soft and hard parts of the object appear with high contrast and spatial resolution in the resulting radiographs. The beam hardening correction procedure is fully automated using a set of the calibrators and appropriate software modules
  • Keywords
    X-ray apparatus; X-ray effects; radiography; semiconductor counters; X-ray microradiography; beam hardening correction; beam hardening effects; digital X-ray semiconductor detector; image distortion; Attenuation; Calibration; Dynamic range; Polynomials; Radiography; Semiconductor device noise; Spatial resolution; X-ray detection; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2005 IEEE
  • Conference_Location
    Fajardo
  • ISSN
    1095-7863
  • Print_ISBN
    0-7803-9221-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2005.1596959
  • Filename
    1596959