Title :
Zeroing in on a zero-temperature coefficient point
Author :
Filanovsky, I.M. ; Najafizadeh, L.
Author_Institution :
Alberta Univ., Edmonton, Alta., Canada
Abstract :
The transconductance characteristics of MOS transistors realized in 0.18 μm CMOS technology have a zero-temperature coefficient (ZTC) bias point. The presence of this point influences performance of both analog and digital circuits. The offset voltage drift in a source-coupled differential pair strongly increases, if the transistor drain currents are equal to the bias currents of ZTC point. It is also impossible to find the drain voltage optimizing the temperature stability of propagation delay in digital circuits. One has to divide the digital circuits in two types. In the first type (CPU circuits) the optimal drain voltage is equal to ZTC bias point voltage of n-channel transistors, in the second case (SRAM circuits) the optimal drain voltage is equal to the absolute value of the ZTC bias point voltage of p-channel transistors.
Keywords :
MOSFET; 0.18 micron; CMOS technology; CPU circuit; MOS transistor; SRAM circuit; analog circuit; digital circuit; offset voltage drift; propagation delay; source-coupled differential pair; temperature stability; transconductance characteristics; zero-temperature coefficient point; CMOS technology; Central Processing Unit; Circuit stability; Digital circuits; MOSFETs; Propagation delay; Random access memory; Temperature; Transconductance; Voltage;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1187209