DocumentCode
3299772
Title
Extraction and modelling of thermal behavior in trench isolated bipolar structures
Author
Walkey, David J. ; Smy, Tom J. ; Marchesan, David ; Tran, Hai ; Reimer, Chris ; Kleckner, Todd C. ; Jackson, Michael K. ; Schroter, Michael ; Long, John R.
Author_Institution
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
fYear
1999
fDate
1999
Firstpage
97
Lastpage
100
Abstract
A new thermal dissipation mechanism in small geometry trench isolated devices is demonstrated through measurement and simulation. Limitations on the extraction and performance of single and double exponential transient thermal models are illustrated using measurements on devices with a wide range of geometries
Keywords
bipolar integrated circuits; integrated circuit measurement; integrated circuit modelling; isolation technology; thermal analysis; thermal resistance; exponential transient thermal models; small geometry trench isolated devices; thermal behavior extraction; thermal behaviour modelling; thermal dissipation mechanism; trench isolated bipolar structures; Capacitance; Circuit simulation; Computer networks; Conducting materials; Geometry; Pulse measurements; Solid modeling; Temperature; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 1999. Proceedings of the 1999
Conference_Location
Minneapolis, MN
ISSN
1088-5714-0
Print_ISBN
0-7803-5712-4
Type
conf
DOI
10.1109/BIPOL.1999.803535
Filename
803535
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