Title :
On the verification and validation of protocols with high fault coverage using UIO sequences
Author :
Sun, X. ; Shen, Y.-N. ; Lombardi, F.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
Various new classes of unique input/output (UIO) sequences for verification and validation (conformance testing) of protocols modeled as finite state machines (FSMs) are presented. The proposed sequences are referred to as adaptive because test sequence generation is not a mere concatenation of test subsequences for all edges of the FSM, but rather subsequences are concatenated using appropriate conditions in the UIO sequence for length minimization and no degradation of fault coverage
Keywords :
conformance testing; fault tolerant computing; finite state machines; formal verification; protocols; conformance testing; fault coverage; finite state machines; input output sequence; protocol verification; test sequence generation; validation; Automata; Certification; Computer science; Concatenated codes; Degradation; Distributed computing; Protocols; Sequential analysis; Sun; Testing;
Conference_Titel :
Reliable Distributed Systems, 1992. Proceedings., 11th Symposium on
Conference_Location :
Houston, TX
Print_ISBN :
0-8186-2890-1
DOI :
10.1109/RELDIS.1992.235126
