Title :
Supervised texture classification using several features extraction techniques based on ANN and SVM
Author :
Ashour, Mohammed W. ; Hussin, Mahmoud F. ; Mahar, Khaled M.
Author_Institution :
Arab Acad. for Sci. & Technol. & Maritime Transp., Alexandria
fDate :
March 31 2008-April 4 2008
Abstract :
Texture classification is one of the most important clues of visual processing applications .In this paper, we present a comparison between the most two popular supervised texture classification methods based on the feed forward Artificial Neural Network (ANN) and the multi-class Support Vector Machine (SVM). Five of the most common used features extraction approaches were chosen in order to extract input vectors of different sizes for both classifiers. These approaches are namely gray level histogram, edge detection, and co-occurrence matrices, besides Gabor and Biorthogonal wavelet transformations. Experiments are conducted on two different datasets the first one is engineering surface textures produced by different machining processes, and the second was taken from Brodatz (1966) textures album. The classification accuracy rate is calculated for ANN and SVM in order to measure the efficiency of each technique based on the several features extraction methods. The results show that SVM with its linear and polynomial kernels is higher in classification accuracy and faster in training time.
Keywords :
edge detection; feature extraction; image texture; neural nets; support vector machines; artificial neural network; co-occurrence matrices; edge detection; features extraction techniques; gray level histogram; support vector machine; texture classification; Artificial neural networks; Data engineering; Feature extraction; Feeds; Histograms; Image edge detection; Machining; Support vector machine classification; Support vector machines; Surface texture; Feature extraction; Supervised neural network; Support Vector Machine; Texture Classification;
Conference_Titel :
Computer Systems and Applications, 2008. AICCSA 2008. IEEE/ACS International Conference on
Conference_Location :
Doha
Print_ISBN :
978-1-4244-1967-8
Electronic_ISBN :
978-1-4244-1968-5
DOI :
10.1109/AICCSA.2008.4493588