Title :
Digital Modulation/Demodulation Measurement System within Connected Solution
Author :
Su, Sy-Haur ; Lin, Shuw-Guann ; Hsiao, Hsu-Feng ; Chang, Da-Chiang ; Chiou, Hwann-Kaeo
Author_Institution :
Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
This paper proposes a digital modulation /demodulation measurement system implemented by the Agilent advanced design system (ADS)-connected solution with vector signal analyzer (VSA) software, VSA instrument built into an analog digital converter (ADC), and an ESG vector signal generator. The ADS system software is suitable to design a digital modulation signal for error vector magnitude (EVM) analysis in RF transmitter (TX). The bit error rate (BER) analysis in RF receiver (RX) was estimated by the recording file from VSA software simultaneously. The proposed testing platform can measure the characteristics of RF transceivers, such as EVM, BER, constellation, and eye diagrams. The nonlinearity and distortion properties were evaluated through the EVM system parameter.
Keywords :
analogue-digital conversion; error statistics; measurement systems; modulation; radio transceivers; signal generators; vectors; ADC; Agilent ADS-connected solution; Agilent advanced design system-connected solution; BER analysis; ESG vector signal generator; EVM analysis; RF RX; RF TX; RF receiver; RF transceiver; RF transmitter; VSA software; analog digital converter; bit error rate analysis; constellation diagram; digital modulation signal design; digital modulation-demodulation measurement system; distortion property; error vector magnitude analysis; eye diagram; nonlinearity property; recording file estimation; vector signal analyzer software; Bit error rate; Demodulation; Radio frequency; Software; Software measurement; ADC; BER; EVM;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1925-6
DOI :
10.1109/IMS3TW.2012.20
