DocumentCode :
3301059
Title :
An extended framework for reliability analysis of ict for power systems
Author :
Konig, Johan ; Narman, P. ; Franke, Ulrik ; Nordstrom, L.
Author_Institution :
Dept. Ind. Inf. & Control Syst., KTH, Stockholm, Sweden
fYear :
2011
fDate :
19-23 June 2011
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents an extended probabilistic framework for reliability analysis of Information and Communication Technology (ICT) for power systems. The framework is based on Probabilistic Relational Models (PRMs) and includes the analysis of both primary equipment and the supporting ICT systems. The framework also separates between the functional structure and the physical infrastructure. To be able to analyze architectural properties, such as redundancy, the framework is extended with logical gates which are based on AND and OR logic. The gates serve and important purpose when integrating the framework into an analysis tool that supports PRMs. The problem without logical gates is the dynamic sizing of the conditional probability tables which depend on the number of parent nodes. This problem is solved by using aggregation functions. The application of the extended framework is demonstrated by applying to an example system-architecture with two types of redundant configurations.
Keywords :
logic gates; power system reliability; probability; substation automation; AND logic; ICT; OR logic; conditional probability table; information and communication technology; logical gate; power system reliability analysis; probabilistic relational model; substation automation; Bayesian methods; Computer architecture; Logic gates; Probabilistic logic; Probability distribution; Reliability engineering; Bayesian networks; Logical Gates; Power Systems; Probabilistic Relational Models; Reliability; Substation Automation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
PowerTech, 2011 IEEE Trondheim
Conference_Location :
Trondheim
Print_ISBN :
978-1-4244-8419-5
Electronic_ISBN :
978-1-4244-8417-1
Type :
conf
DOI :
10.1109/PTC.2011.6019343
Filename :
6019343
Link To Document :
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