• DocumentCode
    3301059
  • Title

    An extended framework for reliability analysis of ict for power systems

  • Author

    Konig, Johan ; Narman, P. ; Franke, Ulrik ; Nordstrom, L.

  • Author_Institution
    Dept. Ind. Inf. & Control Syst., KTH, Stockholm, Sweden
  • fYear
    2011
  • fDate
    19-23 June 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents an extended probabilistic framework for reliability analysis of Information and Communication Technology (ICT) for power systems. The framework is based on Probabilistic Relational Models (PRMs) and includes the analysis of both primary equipment and the supporting ICT systems. The framework also separates between the functional structure and the physical infrastructure. To be able to analyze architectural properties, such as redundancy, the framework is extended with logical gates which are based on AND and OR logic. The gates serve and important purpose when integrating the framework into an analysis tool that supports PRMs. The problem without logical gates is the dynamic sizing of the conditional probability tables which depend on the number of parent nodes. This problem is solved by using aggregation functions. The application of the extended framework is demonstrated by applying to an example system-architecture with two types of redundant configurations.
  • Keywords
    logic gates; power system reliability; probability; substation automation; AND logic; ICT; OR logic; conditional probability table; information and communication technology; logical gate; power system reliability analysis; probabilistic relational model; substation automation; Bayesian methods; Computer architecture; Logic gates; Probabilistic logic; Probability distribution; Reliability engineering; Bayesian networks; Logical Gates; Power Systems; Probabilistic Relational Models; Reliability; Substation Automation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    PowerTech, 2011 IEEE Trondheim
  • Conference_Location
    Trondheim
  • Print_ISBN
    978-1-4244-8419-5
  • Electronic_ISBN
    978-1-4244-8417-1
  • Type

    conf

  • DOI
    10.1109/PTC.2011.6019343
  • Filename
    6019343