DocumentCode :
3301114
Title :
Investigation of thermal interface material on system-level light-emitting diode
Author :
Lee, Zhi-Yin ; Devarajan, Mutharasu
Author_Institution :
Nano-Optoelectron. Lab., Univ. Sains Malaysia, Minden, Malaysia
fYear :
2012
fDate :
5-7 Jan. 2012
Firstpage :
1
Lastpage :
2
Abstract :
Generally, the effect of thermal interface material on thermal behavior of system-level light-emitting diode was presented. Application of thermal tape and thermal paste were selected to be applied on the contacting surfaces between package and heat sink. Thermal Transient Tester and T3Ster-Master software were adopted for thermal transient recording and evaluation. From the studies, it was observed that the selection of thermal interface material had a great impact on thermal management of light-emitting diode. Employing thermal paste as boundary condition revealed a reduction of about 6% in junction to ambient thermal resistance compared to thermal tape. In this paper, the thermal responses of the light-emitting diode with corresponding boundary conditions have been clearly discussed in terms of materials properties such as thermal conductivity, thickness and viscosity of the selected thermal interface materials.
Keywords :
heat sinks; light emitting diodes; thermal conductivity; thermal management (packaging); thermal resistance; viscosity; T3Ster-master software; ambient thermal resistance; application tape; boundary condition; contacting surfaces; heat sink; junction reduction; materials properties; system-level light-emitting diode; thermal conductivity; thermal interface material; thermal management; thermal paste; thermal tape; thermal transient recording; thermal transient tester; thickness property; viscosity property; Educational institutions; Electronic packaging thermal management; Heat sinks; Heat transfer; Light emitting diodes; Thermal analysis; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Enabling Science and Nanotechnology (ESciNano), 2012 International Conference on
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4577-0799-5
Type :
conf
DOI :
10.1109/ESciNano.2012.6149690
Filename :
6149690
Link To Document :
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