Determining of Magnetic Resonance Forces on a MEMS Cantilever in a Fusarium Graminearum Spore Detector

Author

Rowe, Mike ; Dinh, Anh

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Saskatchewan, Saskatoon, SK, Canada

fYear

2012

fDate

14-16 May 2012

Firstpage

105

Lastpage

107

Abstract

Magnetic Resonance Force Microscopy is used in a sensor to detect Fusarium Graminearum fungus. The sensor uses an array of MEMS cantilevers to detect the chemical composition of a sample. The sample is adhered by an antifungal antibody to the surface below the cantilever. Computer simulations are used to determine the force which acts on the cantilever given an RF pulse of a given frequency. The results from this work are used in the design of a cantilever of the target sensor and can be expanded on for detection of other spore types.

Keywords

cantilevers; chemical sensors; magnetic resonance spectroscopy; microsensors; sensor arrays; Fusarium Graminearum fungus detection; Fusarium Graminearum spore detector; MEMS cantilever; RF pulse cantilever; antifungal antibody; computer simulation; magnetic resonance force microscopy determination; sample chemical composition detection; sensor array; target sensor cantilever; Force; Magnetic fields; Magnetic sensors; Microscopy; Radio frequency; Resonant frequency; Magnetic force microscopy; electromechanical sensors; magnetic sensors; mold spore detection;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International

Conference_Location

Taipei

Print_ISBN

978-1-4673-1925-6

Type

conf

DOI

10.1109/IMS3TW.2012.30

Filename

6298726