An Infrastructure for Analog Circuits Testing

Author

Ting, Hsin-Wen ; Yang, Cing-Wen

Author_Institution

Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan

fYear

2012

fDate

14-16 May 2012

Firstpage

108

Lastpage

112

Abstract

This paper presents an infrastructure for analog circuits testing. The proposed infrastructure is designed by the concept of the switch-current (SI) circuit. Two operating modes, which are loading mode and observing one, are used to complete the associated testing procedure. This proposed infrastructure is digitally controlled by switches and a capacitor is used to store the associated analog voltage level. Then the infrastructure can be extended to accomplish a wider range of analog signal. Simulation results also demonstrate the effectiveness of the proposed infrastructure for analog circuit testing.

Keywords

analogue circuits; capacitors; circuit testing; digital control; switches; SI circuit; analog circuit testing; analog voltage level; capacitor; digital control; loading mode; observing mode; switch-current circuit; Analog circuits; Built-in self-test; Loading; Silicon; Switches; Switching circuits; analog circuit testing; digitally controlled; infrastructure; loading and observing modes; switch-current (SI) circuit;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International

Conference_Location

Taipei

Print_ISBN

978-1-4673-1925-6

Type

conf

DOI

10.1109/IMS3TW.2012.31

Filename

6298727