Title :
A Study on the Design of a Testable Fleischer-Laker Switched-Capacitor Biquad
Author :
Hung, Shao-Feng ; Lin, Long-Yi ; Hong, Hao-Chiao
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
The Fleischer-Laker Switched-Capacitor (SC) biquad is a versatile building block for implementing analog filters. This paper studies how to design a testable Fleischer-Laker SC biquad based on the static linear behavior (SLB) analog fault model. In particular, we focus on how to achieve a 100% parametric fault coverage without sacrificing the design flexibility. We suggest not to use the capacitors L, K, and J in the most generalized Fleischer-Laker biquad so as to achieve a 100% parametric fault coverage defined by the SLB analog fault model.
Keywords :
biquadratic filters; failure analysis; switched capacitor filters; Fleischer-Laker SC biquad; SLB analog fault model; analog filters; design flexibility; generalized Fleischer-Laker biquad; parametric fault coverage; static linear behavior; testable Fleischer-Laker switched-capacitor biquad design; Analog circuits; Capacitors; Circuit faults; Computational modeling; Equations; Mathematical model; Transfer functions; Analog fault model; Fleischer-Laker biquad; Switched-capacitor circuits;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1925-6
DOI :
10.1109/IMS3TW.2012.33
