DocumentCode :
3301371
Title :
Compatibility of ferroelectric films in development of transmission lines for MMIC
Author :
Ahmad, Rafidah ; Nadzar, Hanisah M. ; Sulaiman, Suhana ; Mohamad, Salina ; Rusop, M. ; Awang, Z.
Author_Institution :
Microwave Technol. Centre, Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2012
fDate :
5-7 Jan. 2012
Firstpage :
1
Lastpage :
2
Abstract :
Ferroelectric materials offer promising features that are useful for microelectronic devices but they have not been popular for microwave integrated circuits due their preparation methods which are not compatible with integrated circuit manufacturing. In contrast, new dielectric materials are required for microwave integrated circuits (MIC) so that their performance is improved. Improved materials are needed to build transmission lines, which are basic building blocks in integrated circuit architecture. The main issues facing monolithic microwave integrated circuit (MMIC) technology today are power consumption and reliability. These are due to the high loss, poor resistivity and low permittivity dielectric materials used currently in MMIC [1]. There is therefore an urgent need to replace existing dielectrics with those that offer better high frequency response in terms of less loss, high resistivity and high permittivity. The main issues facing monolithic microwave integrated circuit (MMIC) technology today are power consumption and reliability. These are due to the high loss, poor resistivity and low permittivity dielectric materials used currently in MMIC [1, 2]. There is therefore an urgent need to replace existing dielectrics with those that offer better high frequency response in terms of less loss, high resistivity and high permittivity.
Keywords :
MMIC; electrical resistivity; ferroelectric thin films; frequency response; lead compounds; magnesium compounds; permittivity; power consumption; transmission lines; zinc compounds; MMIC technology; MgZnO; PZT; electrical resistivity; ferroelectric films; frequency response; low permittivity dielectric materials; microelectronic devices; microwave integrated circuits; monolithic microwave integrated circuit technology; power consumption; reliability; transmission lines; Films; MMICs; Microwave circuits; Permittivity; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Enabling Science and Nanotechnology (ESciNano), 2012 International Conference on
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4577-0799-5
Type :
conf
DOI :
10.1109/ESciNano.2012.6149700
Filename :
6149700
Link To Document :
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