Abstract :
The following topics are dealt with: mixed signal circuits; converter testing; biosensing; lab-on-a-chip testing; RF testing; PLL testing; analog design for testability; and MEMS sensor.
Keywords :
analogue circuits; biosensors; design for testability; lab-on-a-chip; microsensors; mixed analogue-digital integrated circuits; phase locked loops; MEMS sensor; PLL testing; RF testing; analog design for testability; biosensing; converter testing; lab-on-a-chip testing; mixed signal circuits;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1925-6
DOI :
10.1109/IMS3TW.2012.1
