• DocumentCode
    3301423
  • Title

    ZnO nanostructures grown on porous silicon substrate without catalyst

  • Author

    Rusli, Nurul Izni ; Abdulgafour, Hind ; Hassan, Zainuriah ; Yam, Fong Kwong ; Ali, Nihad K. ; Hashim, Abdul Manaf ; Mahmood, Mohamad Rusop ; Nayan, Nafarizal

  • Author_Institution
    Mater. Innovations & Nanoelectron. Res. Group, Univ. Teknol. Malaysia, Skudai, Malaysia
  • fYear
    2012
  • fDate
    5-7 Jan. 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    ZnO nanostructure is one of the most interesting compound semiconductors due to its enormous potential applications in the electronics and optical devices [1,2]. In this work, ZnO nanostructures were grown on porous silicon (PS) substrate without any catalyst by a simple thermal evaporation method. It has been found that PS with a rough surface morphology is an ideal growth template for growing ZnO nanostructures without the use of any metal catalysts [1-5]. PS structure was fabricated by using electrochemical etching method in HF/ethanol solution. The morphology of PS sample was investigated by scanning electron microscopy (SEM). The field-emission scanning electron microscopy (FESEM), energy dispersive X-ray (EDX), X-ray diffraction (XRD), Raman and photo luminescence (PL) analysis were used to characterize the as-grown ZnO nanostructures.
  • Keywords
    II-VI semiconductors; Raman spectra; X-ray chemical analysis; X-ray diffraction; etching; evaporation; field emission electron microscopy; nanofabrication; nanostructured materials; photoluminescence; rough surfaces; scanning electron microscopy; semiconductor growth; surface morphology; wide band gap semiconductors; zinc compounds; Raman analysis; Si; X-ray diffraction; ZnO; electrochemical etching; electronic devices; energy dispersive X-ray analysis; field emission scanning electron microscopy; ideal growth template; luminescence analysis; nanostructure; optical devices; porous silicon; rough surface morphology; scanning electron microscopy; thermal evaporation method; Nanostructures; Silicon; Substrates; X-ray diffraction; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Enabling Science and Nanotechnology (ESciNano), 2012 International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4577-0799-5
  • Type

    conf

  • DOI
    10.1109/ESciNano.2012.6149704
  • Filename
    6149704